HR-TEM

High Resolution Transmission Electron Microscopy (HR-TEM)

Transmission Electron Microscopy (TEM) is a powerful imaging technique used to obtain high-resolution, two-dimensional images of the internal structure of a sample. It works by transmitting a beam of electrons through a thin section of the sample and detecting the signals that pass through or scatter from the sample. TEM is important because it allows researchers to visualize and analyze the internal structure and composition of materials at atomic resolution. It provides detailed information about the arrangement of atoms, crystal defects, grain boundaries, and interfaces within a material. TEM can also reveal information about the size, shape, and distribution of nanoparticles or nanoscale features within a sample.

 

So if you have questions such as,

How to interpret TEM images?

How to include TEM images into analysis?

How to prepare sample for TEM analysis?

How to estimate particles size in TEM analysis images?

Our professional team are there to analyse your HR-TEM images. Just submit your order and our experts will contact you as soon as possible.

In addition to imaging, TEM can also be used for elemental analysis using energy-dispersive X-ray spectroscopy (EDS) or electron energy-loss spectroscopy (EELS). These techniques detect the characteristic X-rays or energy losses that occur when the electron beam interacts with the sample, providing information about the elemental composition and chemical bonding within the sample. TEM is widely used in various fields such as materials science, nanotechnology, biology, and solid-state physics. It is used for research, characterization, and understanding of materials at the atomic scale. TEM is particularly valuable in studying the structure-property relationships of materials, investigating nanoscale phenomena, and designing new materials with specific properties. Overall, TEM plays a crucial role in advancing our understanding of materials and their behavior at the atomic and nanoscale.

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